Wednesday, 12 November 2014

Two good things that are better together: STM combined with X-ray synchrotron microscopy

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(Phys.org) —Over the past three decades, scanning tunneling microscopy (STM) has rapidly become a major component of the condensed matter physics toolbox. While STM can provide vast quantities of data about the electronic, structural, and magnetic properties of materials at atomic resolution, its Achilles heel is its inability to characterize elemental species. But a team from Argonne National Laboratory and Ohio University has found a way around this limitation by combining STM with the spectroscopic versatility of synchrotron x-rays, achieving chemical fingerprinting of individual nickel clusters on a copper surface at a resolution of 2 nm, creating a powerful and versatile nanoscale imaging tool with exciting promise and potential for the materials and biological sciences. Their work was published in Nano Letters.



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